Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
https://doi.org/10.1109/MDAT.2013.2271420
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/record/display.uri?eid=2-s2.0-84896770007&origin=inward&txGid=5ed5ca61bc3f8b371a8f5eda07d0a6c0
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2014
https://www.webofscience.com/wos/woscc/full-record/WOS:000332030500010