Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy
Kask, Erkki
;
Grossberg, Maarja
;
Josepson, Raavo
;
Salu, Pille
;
Timmo, Kristi
;
Krustok, Jüri
Materials science in semiconductor processing
2013
/
p. 992-996 : ill
https://doi.org/10.1016/j.mssp.2013.02.009
https://www.scopus.com/sourceid/26675
https://www.scopus.com/record/display.uri?eid=2-s2.0-84877584075&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1016%2Fj.mssp.2013.02.009%29&sessionSearchId=2578bba73f583d2598e5d9854114f0a3
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MAT%20SCI%20SEMICON%20PROC&year=2013
https://www.webofscience.com/wos/woscc/full-record/WOS:000319641500062