DSP-based electrical impedance tomography device : implementation and experiments
Abdullayev, Anar
;
Rist, Marek
;
Metshein, Margus
;
Märtens, Olev
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2025
/
6 p
https://doi.org/10.1109/I2MTC62753.2025.11079140
https://www.scopus.com/sourceid/15045
https://www.scopus.com/pages/publications/105012224600?origin=resultslist
https://www.webofscience.com/wos/woscc/full-record/WOS:001554207900206