• Wideband frequency diagnosis for high-sensitivity turn-insulation degradation estimation in inverter-fed machinesSardar, Muhammad Usman; Vaimann, Toomas; Kütt, Lauri; Asad, Bilal; Kallaste, Ants; Raja, Hadi Ashraf2025 IEEE Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED) : proceedings2025 / 7 p https://doi.org/10.1109/SDEMPED53223.2025.11154298 https://www.scopus.com/pages/publications/105017761811?origin=resultslist