A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs

autor
Cardoso Medeiros, Guilherme
Fieback, Moritz
Wu, Lizhou
vastutusandmed
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
allikas
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 792-797
konverentsi nimetus, aeg
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
konverentsi toimumispaik
Grenoble, France
võtmesõna
FinFET
SRAM
hard-to-detect faults
DFT
memory testing
ISBN
978-3-9819263-4-7
märkused
Bibliogr.: 24 ref
TTÜ struktuuriüksus
keel
inglise
Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797.