A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs

vastutusandmed
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
allikas
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 792-797
konverentsi nimetus, aeg
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
konverentsi toimumispaik
Grenoble, France
võtmesõna
FinFET
SRAM
hard-to-detect faults
DFT
memory testing
ISBN
978-3-9819263-4-7
märkused
Bibliogr.: 24 ref
TTÜ struktuuriüksus
keel
inglise
Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797.