Implementation-independent functional test generation for RISC microprocessors

vastutusandmed
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 82-87 : ill
konverentsi nimetus, aeg
27th IFIP/IEEE International Conference on Very Large Scale Integration, October 6-9, 2019
konverentsi toimumispaik
Cusco, Peru
ISSN
2324-8440
2324-8432
ISBN
978-1-7281-3915-9
978-1-7281-3916-6
märkused
Bibliogr.: 34 ref
TTÜ struktuuriüksus
keel
inglise
Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. Implementation-independent functional test generation for RISC microprocessors // VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]. Piscataway : IEEE, 2019. p. 82-87 : ill.