prindi

Defect-oriented library builder and hierarchical test generation

autor
Cibakova, Tatiana
Gramatova, Elena
Kuzmicz, W.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
T.Cibakova, E.Gramatova, W.Kuzmicz, W.Pleskacz, J.Raik, R.Ubar
allikas
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
ilmumiskoht
[S. l.]
ilmumisaasta
2001
leheküljed
p. 163-168 : ill
ISBN
963 7175 16 4
märkused
Bibliogr.: 11 ref
Cibakova, T., Gramatova, E., Kuzmicz, W., Pleskacz, W., Raik, J., Ubar, R. Defect-oriented library builder and hierarchical test generation // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 163-168 : ill.