Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits

vastutusandmed
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
ajakirja aastakäik number kuu
Vol. 32, 3
ilmumisaasta
leheküljed
p. 273-289 : ill
ISSN
0923-8174
märkused
Bibliogr.: 44 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Squillero, G., Tihhomirov, V., Kostin, S., Raik, J., Ubar, R. et al. Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits // Journal of electronic testing : theory and applications (JETTA) (2016) Vol. 32, 3, p. 273-289 : ill.