A synthesis-agnostic behavioral fault model for high gate-level fault coverage

vastutusandmed
Anton Karputkin, Jaan Raik
allikas
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 1124-1127 : ill
konverentsi nimetus, aeg
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 14-18 March, 2016
konverentsi toimumispaik
Dresden, Germany
ISSN
1558-1101
ISBN
978-3-9815370-6-2
märkused
Bibliogr.: 19 ref
TTÜ struktuuriüksus
keel
inglise
Karputkin, A., Raik, J. A synthesis-agnostic behavioral fault model for high gate-level fault coverage // Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany. [S.l.] : EDAA, 2016. p. 1124-1127 : ill.