A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers

vastutusandmed
Pietro Saltarelli, Behrad Niazmand, Jaan Raik, Vineeth Govind, Thomas Hollstein, Gert Jervan, Ranganathan Hariharan
allikas
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
ilmumiskoht
New York
kirjastus/väljaandja
ACM
ilmumisaasta
leheküljed
[8] p. : ill
konverentsi nimetus, aeg
9th International Symposium on Networks-on-Chip, September 28-30, 2015
konverentsi toimumispaik
Vancouver, BC, Canada
võtmesõna
fault tolerant router design
embedded test
test packets
ISBN
978-1-4503-3396-2
märkused
Bibliogr.: 21 ref
TTÜ struktuuriüksus
keel
inglise
Saltarelli, P., Niazmand, B., Raik, J., Govind, V., Hollstein, T., Jervan, G., Hariharan, R. A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers // NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015. New York : ACM, 2015. [8] p. : ill.