Challenges of reliability assessment and enhancement in autonomous systems

vastutusandmed
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
allikas
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
6 p
konverentsi nimetus, aeg
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2-4 Oct. 2019
konverentsi toimumispaik
Noordwijk, Netherlands
ISSN
1550-5774
ISBN
978-1-7281-2261-8
märkused
Bibliogr.: 45 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Reorda, M., Balakrishnan, A., Alexandrescu, D. Challenges of reliability assessment and enhancement in autonomous systems // 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019). [S.l.] : IEEE, 2019. 6 p.