Hierarchical approaches to test generation and fault simulation

vastutusandmed
Ubar, R.
ajakirja aastakäik number kuu
3
ilmumisaasta
leheküljed
p. 204
ISSN
1563-0064
märkused
Special issue: Proceedings of East-West Design & Test Conference (EWDTC’03): Yalta, Alushta, Crimea, Ukraine, September 17-21, 2003
keel
inglise
Ubar, R.-J. Hierarchical approaches to test generation and fault simulation // Radioelectronics and informatics (2003) 3, p. 204.