Marginal PCB assembly defect detection on DDR3/4 memory bus

vastutusandmed
Sergei Odintsov, Artur Jutman and Sergei Devadze
allikas
2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 238-247 : ill
konverentsi nimetus, aeg
48th International Test Conference (ITC), 31 October - 2 November 2017
konverentsi toimumispaik
Fort Worth, USA
ISBN
978-1-5386-3414-1
märkused
Bibliogr.: 20 ref
TTÜ struktuuriüksus
keel
inglise
Odintsov, S., Jutman, A., Devadze, S. Marginal PCB assembly defect detection on DDR3/4 memory bus // 2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017. [S.l.] : IEEE, 2017. p. 238-247 : ill. https://doi.org/10.1109/TEST.2017.8242070