Model based testing of distributed time critical systems

vastutusandmed
Jüri Vain, Gert Kanter, Seshadhri Srinivasan
allikas
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 99-105 : ill
konverentsi nimetus, aeg
6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), September 20-22, 2017
konverentsi toimumispaik
Noida, India
ISBN
978-1-5090-3013-2
märkused
Bibliogr.: 13 ref
TTÜ struktuuriüksus
keel
inglise
Vain, J., Kanter, G., Srinivasan, S. Model based testing of distributed time critical systems // 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017. Piscataway : IEEE, 2017. p. 99-105 : ill. https://doi.org/10.1109/ICRITO.2017.8342406