BASTION : board and SoC test instrumentation for ageing and no failure found

autor
vastutusandmed
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans Kerkhoff, Rene Krenz-Baath, and Piet Engelke
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 115-120 : ill
konverentsi nimetus, aeg
2017 Design, Automation & Test in Europe (DATE), 27-31 March, 2017
konverentsi toimumispaik
Lausanne, Switzerland
võtmesõna
No-Fault-Found
No-Trouble-Found
ISSN
1558-1101
ISBN
978-3-9815370-8-6
märkused
Bibliogr. p. 119-120
TTÜ struktuuriüksus
keel
inglise
Jutman, A., Lotz, C., Larsson, E., Sonza Reorda, M., Jenihhin, M., Raik, J. et al. BASTION : board and SoC test instrumentation for ageing and no failure found // Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland. [S.l.] : IEEE, 2017. p. 115-120 : ill. https://doi.org/10.23919/DATE.2017.7926968