Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters

vastutusandmed
A. Sangwongwanich, D. Zhou, E. Liivik, F. Blaabjerg
ajakirja aastakäik number kuu
vol. 88–90
ilmumisaasta
leheküljed
p. 1003-1007
ISSN
0026-2714
märkused
Bibliogr.: 18 ref
keel
inglise
Sangwongwanich, A., Zhou, D., Liivik, E., Blaabjerg, F. Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters // Microelectronics reliability (2018) vol. 88–90, p. 1003-1007. https://doi.org/10.1016/j.microrel.2018.06.094