Mixed-level identification of fault redundancy in microprocessors

vastutusandmed
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
allikas
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
6 p. : ill
konverentsi nimetus, aeg
20th IEEE Latin American Test Symposium, LATS 2019, March 11th - 13th 2019
konverentsi toimumispaik
Santiago,Chile
ISSN
2373-0862
ISBN
978-1-7281-1756-0
978-1-7281-1757-7
märkused
Bibliogr.: 31 ref
TTÜ struktuuriüksus
keel
inglise
Oyeniran, A. S., Ubar, R., Jenihhin, M., Gürsoy, C. C., Raik, J. Mixed-level identification of fault redundancy in microprocessors // LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019. [S.l.] : IEEE, 2019. 6 p. : ill. https://doi.org/10.1109/LATW.2019.8704591