Combining functional and structural approaches in test generation for digital systems

vastutusandmed
Raimund Ubar
ajakirja aastakäik number kuu
Vol. 38
ilmumisaasta
leheküljed
3, p. 317-329 : ill
märkused
Bibliogr.: 33 ref
keel
inglise
Ubar, R. Combining functional and structural approaches in test generation for digital systems // Microelectronics reliability (1998) Vol. 38, 3, p. 317-329 : ill.