Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
autor
vastutusandmed
M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
allikas
ajakirja aastakäik number kuu
Vol. 41
ilmumisaasta
leheküljed
p. 2023-2040 : ill
ISSN
0026-2714
märkused
Bibliogr.: 31 ref
Blyzniuk, M., Kazymyra, I., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J. Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement // Microelectronics reliability (2001) Vol. 41, p. 2023-2040 : ill.