Assembling low-level tests to high-level symbolic test frames

vastutusandmed
G.Jervan, A.Markus, J.Raik, R.Ubar
ilmumiskoht
[Copenhagen]
ilmumisaasta
leheküljed
p. 275-280: ill
märksõna
märkused
Tiitellehel: ... 15th NORCHIP Seminar. Bibl. 6 ref
keel
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Assembling low-level tests to high-level symbolic test frames // Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997. [Copenhagen], 1997. p. 275-280: ill.