Functional level testability analysis for digital circuits

vastutusandmed
Raimund Ubar, Krzysztof Kuchcinski
allikas
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
ilmumiskoht
Rotterdam
ilmumisaasta
leheküljed
p. 545-546
märkused
Bibl. p. 546
keel
inglise
Ubar, R., Kuchcinski, K. Functional level testability analysis for digital circuits // ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993. Rotterdam, 1993. p. 545-546.