Mixed-level deterministic-random test generation for digital systems

vastutusandmed
G. Jervan, A. Markus, J. Raik, R. Ubar
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
p. 335-340
keel
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Mixed-level deterministic-random test generation for digital systems // Proceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 1998. [S.l.], 1998. p. 335-340.