prindi

Hierarchical test generation for complex digital systems with control and data processing parts

autor
Ubar, Raimund-Johannes
Raik, Jaan
vastutusandmed
R. Ubar, J. Raik
allikas
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
ilmumiskoht
[S.l.]
kirjastus/väljaandja
SEMI
ilmumisaasta
1999
leheküljed
p. 43-52
märksõna
digitaaltehnika
testimine
testid
keel
inglise
Ubar, R., Raik, J. Hierarchical test generation for complex digital systems with control and data processing parts // "Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999. [S.l.] : SEMI, 1999. p. 43-52.