Testability guided hierarchical test generation with decision diagrams

vastutusandmed
R.Ubar, J.Raik, T.Nõmmeots
ilmumiskoht
Copenhagen
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 265-271
Ubar, R.-J., Raik, J., Nõmmeots, T. Testability guided hierarchical test generation with decision diagrams // 20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002. Copenhagen : TechnoData, 2002. p. 265-271.