RT-level test point insertion for sequential circuits

vastutusandmed
Jaan Raik, Vineeth Govind, Raimund Ubar
allikas
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 34-40 : ill
konverentsi nimetus, aeg
IEEE 1st International Workshop on Testability Assessment, November 2, 2004
konverentsi toimumispaik
Rennes, France
ISBN
0-7803-8851-8
märkused
Bibliogr.: 10 ref
keel
inglise
Raik, J., Govind, V., Ubar, R.-J. RT-level test point insertion for sequential circuits // IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings. Piscataway : IEEE, 2004. p. 34-40 : ill.