Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005 (allikas)

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    An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill
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    Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill
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    Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill
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    Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environmentHe, Zhiyuan; Jervan, Gert; Peng, Zebo; Eles, PetruProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 83-86 : ill
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