Off-line testing of delay faults in NoC interconnects

vastutusandmed
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimund Ubar, Zebo Peng
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 677-680 : ill
konverentsi nimetus, aeg
9th EUROMICRO Conference on Digital Systems Design, 30 August-1 September, 2006
konverentsi toimumispaik
Cavtat, Croatia
ISBN
978-0-7695-2609-6
märkused
Bibliogr.: 13 ref
TTÜ struktuuriüksus
keel
inglise
Bengtsson, T., Jutman, A., Kumar, S., Peng, Z., Ubar, R.-J. Off-line testing of delay faults in NoC interconnects // 9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings. Los Alamitos : IEEE Computer Society, 2006. p. 677-680 : ill. http://dx.doi.org/10.1109/DSD.2006.72