prindi

RT-level identification of potentially testable initialization faults

autor
Raik, Jaan
Fujiwara, Hideo
Krivenko, Anna
vastutusandmed
J.Raik, H.Fujiwara, A.Krivenko
allikas
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
ilmumiskoht
Sapporo
ilmumisaasta
2008
leheküljed
[6] p
Raik, J., Fujiwara, H., Krivenko, A. RT-level identification of potentially testable initialization faults // The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan. Sapporo, 2008. [6] p.