Constraint-based test pattern generation at the register-transfer level

vastutusandmed
Taavi Viilukas, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Anna Krivenko
allikas
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 352-357 : ill
konverentsi nimetus, aeg
13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010
konverentsi toimumispaik
Vienna, Austria
ISBN
978-1-4244-6610-8
märkused
Bibliogr.: 21 ref
keel
inglise
Viilukas, T., Raik, J., Jenihhin, M., Ubar, R., Krivenko, A. Constraint-based test pattern generation at the register-transfer level // Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria. [S.l.] : IEEE, 2010. p. 352-357 : ill. http://dx.doi.org/10.1109/DDECS.2010.5491752