Parallel X-fault simulation with critical path tracing technique [Electronic resource]

vastutusandmed
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
allikas
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
ilmumiskoht
[Dresden]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 879-884 [CD-ROM]
konverentsi nimetus, aeg
DATE : Design, Automation & Test in Europe, 8-12 March, 2010
konverentsi toimumispaik
Dresden, Germany
ISBN
978-3-9810801-6-2
keel
inglise
Ubar, R., Devadze, S., Raik, J., Jutman, A. Parallel X-fault simulation with critical path tracing technique [Electronic resource] // DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010. [Dresden] : IEEE, 2010. p. 879-884 [CD-ROM].