prindi

Diagnostic modeling of digital systems with multi-level decision diagrams

autor
Ubar, Raimund-Johannes
Raik, Jaan
Jutman, Artur
Jenihhin, Maksim
vastutusandmed
Raimund Ubar, Jaan Raik, Artur Jutman, Maksim Jenihhin
allikas
Design and test technology for dependable systems-on-chip
ilmumiskoht
Hershey
kirjastus/väljaandja
Information Science Reference
ilmumisaasta
2011
leheküljed
p. 92-118 : ill
ISBN
978-1-60960-212-3
märkused
Bibliogr. p. 115-118
keel
inglise
Ubar, R., Raik, J., Jutman, A., Jenihhin, M. Diagnostic modeling of digital systems with multi-level decision diagrams // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 92-118 : ill.