prindi

High-level decision diagram simulation for diagnosis and soft-error analysis

autor
Raik, Jaan
Repinski, Urmas
Jenihhin, Maksim
Chepurov, Anton
vastutusandmed
Jaan Raik, Urmas Repinski, Maksim Jenihhin, Anton Chepurov
allikas
Design and test technology for dependable systems-on-chip
ilmumiskoht
Hershey
kirjastus/väljaandja
Information Science Reference
ilmumisaasta
2011
leheküljed
p. 294-309 : ill
ISBN
978-1-60960-212-3
märkused
Bibliogr. p. 307-309
keel
inglise
Raik, J., Repinski, U., Jenihhin, M., Chepurov, A. High-level decision diagram simulation for diagnosis and soft-error analysis // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 294-309 : ill.