prindi

Probabilistic equivalence checking based on high-level decision diagrams

autor
Karputkin, Anton
Ubar, Raimund-Johannes
Tombak, Mati
Raik, Jaan
vastutusandmed
Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik
allikas
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2011
leheküljed
p. 423-428 : ill
konverentsi nimetus, aeg
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011
konverentsi toimumispaik
Gottbus, Germany
ISBN
978-1-4244-9753-9
märkused
Bibliogr.: 14 ref
keel
inglise
Karputkin, A., Ubar, R., Tombak, M., Raik, J. Probabilistic equivalence checking based on high-level decision diagrams // Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany. [S.l.] : IEEE, 2011. p. 423-428 : ill.