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    A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; G├╝rsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797https://doi.org/10.23919/DATE48585.2020.9116278
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