A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278