Action-based learning system for teaching digital electronics and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 3rd European Workshop on Microelectronics Education : France, May 18AMP19, 20002000 / p. 107-110 : ill

Arvuti nööpaugusAgur, UstusHorisont1976 / lk. 12-15 : ill https://www.ester.ee/record=b1072243*est http://www.digar.ee/id/nlib-digar:291330

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)Rang, Toomas; Min, Mart; Ubar, Raimund-Johannes1994

BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, EstoniaRang, Toomas2002 http://www.ester.ee/record=b2150914*est

BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 https://www.ester.ee/record=b1982896*est

BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 http://www.ester.ee/record=b2150914*est

BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics ConferenceRang, Toomas2006 http://www.ester.ee/record=b2150914*est

BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, EstoniaRang, Toomas2008 http://www.ester.ee/record=b2150914*est

BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, EstoniaRang, Toomas2010 http://www.ester.ee/record=b2150914*est

BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 http://www.ester.ee/record=b2150914*est

BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, EstoniaRang, Toomas2014 http://www.ester.ee/record=b2150914*est

BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, EstoniaRang, Toomas2016 http://www.ester.ee/record=b2150914*est

CAD in the education of microelectronics at the Technical University of BudapestSzekely, V.; Tarnay, K.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 146-151

Computer aided simulation of dynamic behaviour of the I²L flip-flopRang, ToomasMicroelectronics '82 : proceedings of the 3. Microelectronics Conference of the Socialist Countries ; from 5.-7. May 1982, Siófok, Hungary1982 / p. 153-154

DAC 2000 - 37th Design Automation ConferenceEllervee, PeeterA & A2000 / 5, lk. 53-54 https://artiklid.elnet.ee/record=b1005204*est

DefSim: measurement environment for CMOS defectsBorejko, Tomasz; Jutman, Artur; Pleskacz, Witold A.; Ubar, Raimund-Johannes2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 22006 / p. 679-682 https://ieeexplore.ieee.org/document/1651048

Design and test technology for dependable systems-on-chip2011 https://www.ester.ee/record=b4467408*est

Development of e-learning course: myths and realityRang, Toomas; Rang, GalinaSymposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Kuressaare, Estonia, January 19-24, 20042004 / p. 9-11

Digitaalmikroelektroonika projekteeriminePõldre, JüriA & A1998 / 4, lk. 14-16

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

Eesti mikroelektroonika osaleb maailma virtuaalses kaubamajasUbar, Raimund-JohannesEesti Päevaleht1998 / 12. veebr., Uus Meedia, lk. 6

E-learning environment in the area of digital microelectronicsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey2004 / p. 278-283 : ill

European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

Exercises. Final test questions : supplementary material in the course "Microelectronics"Rang, Toomas2003 https://www.ester.ee/record=b1766979*est

Flexible controller for educational robot kitRuberg, Priit; Guitar, Aivar; Ellervee, Peeter2015 International Conference on Microelectronic Systems Education : MSE '15 : Pittsburgh, PA, May 20-21, 20152015 / p. 17-20 : ill http://dx.doi.org/10.1109/MSE.2015.7160007

Four years of System-on-Chip curriculaKruus, Margus; Ellervee, PeeterEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 88-91

Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 https://www.ester.ee/record=b2055139*est

Inseneriharidus mikroelektroonika ajastulUbar, Raimund-JohannesTehnikaülikool1998 / 16. nov., lk. 6

Integraalskeemide projekteerimine : metoodiline juhend1988 https://www.ester.ee/record=b1239938*est

Kas Eestil on vaja oma mikroelektroonikat?Ubar, Raimund-JohannesArvutimaailm1993 / 2, lk. 46-47

Kümme korda aeglasem: Venemaa kasutab Hiina protsessorit, kuna lääne omi pole saada ja enda omad veel ei tööta [Võrguväljaanne]Einama, Kaidopostimees.ee2022 10 korda aeglasem: Venemaa kasutab Hiina protsessorit, kuna lääne omi pole saada ja enda omad veel ei tööta

Mikro- und Feinwerktechnik in Lehre und Forschung an der TU TallinnAjaots, MaidoZukunftsaspekte der Feinwerktechnik und Mikrotechnik in Lehre, Forschung und Industriekooperationen : 15. Internationales Kolloquium Feinwerktechnik, 1995 : 25. und 26. September 1995 in Mainz1995 / S. 46-52 https://www.ester.ee/record=b1050005*est

Mikroelektroonika : laboratoorsete tööde juhend erialade 0701 ja 0612 üliõpilastele1991 https://www.ester.ee/record=b1195431*est

Mikroelektroonika kiipide testimise tarkvara turbo-tester : kommentaar Eesti Teaduste Akadeemia Bernhard Schmidti preemia pälvinud tööleRaik, JaanTallinna Tehnikaülikooli aastaraamat 20072008 / lk. 275-278

Mikroelektroonika laboratoorsete tööde juhend erialade 0701 ja 0612 üliõpilastele1986 https://www.ester.ee/record=b1262234*est

Mikroelektroonika on muutumas nanoelektroonikaksKrustok, JüriEesti Päevaleht1996 / 24. apr., lk. 7

Monitoring patient movement velocity using passive infrared sensor informationEhala, Johannes; Astapov, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 21-24 : ill

Näidisülesanded. Test : abimaterjal ainele "Mikroelektroonika"2003 http://www.ester.ee/record=b1766976*est

Pooljuhtkomponentide simuleerimine arvutil : laboratoorse töö juhend2003 http://www.ester.ee/record=b1766958*est

Pooljuhtstruktuuride tööpõhimõtted. Struktuuride realisatsioonid kristallis : abimaterjal ainele "Mikroelektroonika"2003 http://www.ester.ee/record=b1782563*est

PrefaceUbar, Raimund-Johannes; Raik, Jaan; Vierhaus, Heinrich TheodorDesign and test technology for dependable systems-on-chip2011 / p. xxii-xxviii

Principles of semiconductor structures. Realisation of structures in crystals : supplementary lecture material in the subject "Microelectronics"Rang, Toomas2003 http://www.ester.ee/record=b1782565*est

Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est

Selective Laser Melting Of Combustion Synthesized 2Mo-Cu and 3Cu-Mo CompositesMinasyan, Tatevik; Aydinyan, Sofiya; Kharatyan, SurenSHS 2017 : XIV International Symposium On Self-Propagating High Temperature Synthesis, September 25-28, 2017, Tblisi, Georgia : Book of Abstracts2017 / p. 155−156 : ill http://mmi.ge/uploads/files/2017-10/1507298270_book-of-abstracts-shs-2017.pdf

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

Simulation of semiconductor components on PC-s : instruction for laboratory workKurel, Raido2003 http://www.ester.ee/record=b1766967*est

Special issue "Advanced hardware implementations for IoT systems and applications"2022 https://www.mdpi.com/journal/electronics/special_issues/Hardware_IoT

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

Uued tuuled digitaalses fotograafiasKrustok, JüriTehnikamaailm2003 / 10, lk. 50-51

Алгоритмы цифрового усреднения сигналов и их реализация микроэлектронным фильтромLogunov, Gennadi; Sillamaa, HannoМетоды и микроэлектронные средства цифрового преобразования и обработки сигналов : тезисы докладов конференциию, Т. 21983 / с. 174-176 https://www.ester.ee/record=b3715053*est

Влияние технологического микроклимата на качество изделий микроэлектроникиKaipoksin, L.; Puusepp, Ü.; Rätsep, Ülo; Teevet, J.-T.Электронная промышленность : ЭП : научно-технический сборник1983 / с. 76-79 : илл https://www.ester.ee/record=b1802011*est

Исследование и разработка методов тестового диагностирования дискретных систем : автореферат ... доктора технических наук (05.13.13)Ubar, Raimund-Johannes1986 https://www.ester.ee/record=b1564280*est

Микроэлектроника : руководство к лабораторным работам для студентов специальностей 0701, 0612Laansoo, Ants1985 https://www.ester.ee/record=b1253963*est

О влиянии электронно-упрочного рассеяния на коэффициент передачи лико микроэлектронного биполярного транзистораVelmre, Enn; Udal, AndresМатематическое моделирование физических процессов в полупроводниках и полупроводниковых приборах : тезисы докладов II всесоюзного совещания (г. Ярославль, сентябрь 1988 г.)1988 / с. 40

Решение задач проектирования тестов микроэлектронных устройств при помощи АГUbar, Raimund-JohannesТезисы докл. всесоюзн. школы-семинара "Диагностика, надежность контроль"1990 / c. 65