Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

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Fast matrix covering in all programmable systems-on-chipSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, AleksanderElektronika ir elektrotechnika = Electronics and electrical engineering2014 / p. 150-153 : ill

G-GPU : a fully-automated generator of GPU-like ASIC acceleratorsPerez, Tiago Diadami; Gonçalves, Marcio M.; Gobatto, Leonardo; Brandalero, Marcelo; Azambuja, Jose Rodrigo; Pagliarini, Samuel Nascimento2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-23 March 2022 : Antwerp, Belgium2022 / p. 544 - 547 https://doi.org/10.23919/DATE54114.2022.9774758

Interactions of Zynq-7000 devices with general purpose computers through PCI-express : a case study [Electronic resource]Rjabov, Artjom; Sudnitsõn, Aleksander; Sklyarov, Valery; Skliarova, IouliiaProceedings of the 18th Mediterranean Electrotechnical Conference MELECON 2016 : 18-20 April 2016, Limassol, Cyprus2016 / [4] p. : ill. [CD-ROM] https://doi.org/10.1109/MELCON.2016.7495400

LiD-CAT: A lightweight detector for cache ATtacksReinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepulveda, Johanna2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020
Tallinn, Estonia : proceedings2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131603

Split-chip design to prevent IP reverse engineeringPagliarini, Samuel Nascimento; Sweeney, Joseph; Mai, Ken; Blanton, Shawn; Mitra, Subhasish; Pileggi, LarryIEEE Design and Test2020 / p. 109-118 https://doi.org/10.1109/MDAT.2020.3033255 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Zynq-based system for extracting sorted subsets from large data setsSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, AleksanderJournal of microelectronics, electronic components and materials2015 / p. 142-152 : ill