A theoretical study of electron drift mobility anisotropy in n-type 4H- and 6H-SiCVelmre, Enn; Udal, AndresProceedings of the International Conference on Silicon Carbide and Related Materials - 1999 (ICSCRM'99) : Research Triangle Park, North-Carolina, USA, Oct. 10-15, 1999. Vol. 12000 / p. 725-728

Can electrical phenomena be explained with the concept of an "electric family tree"?Järvik, Jaan18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 45-46 : ill https://www.ester.ee/record=b5183874*est

Change in the parameters of electron-irradiated 4H-SIC schottky diodes as a function of the time during low-temperature isothermal annealingKorolkov, Oleg; Kozlovski, Vitali V.; Lebedev, Alexander A.; Toompuu, Jana; Sleptsuk, Natalja; Rang, ToomasSilicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK2019 / p. 734-737 https://doi.org/10.4028/www.scientific.net/MSF.963.734 Conference proceeding at Scopus Article at Scopus

Comparative results of low temperature annealing of lightly doped n-layers of silicon carbide irradiated by protons and electronsKozlovski, Vitali V.; Korolkov, Oleg; Lebedev, Alexander A.; Toompuu, Jana; Sleptsuk, NataljaSilicon Carbide and Related Materials 2019 : 18th International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019), Kyoto, Japan, September 29 - October 4, 20192020 / p. 231-236 https://doi.org/10.4028/www.scientific.net/MSF.1004.231 Conference Proceedings at Scopus Article at Scopus

Corrected accounting of electron-hole scattering in cross-term current equations for Si and SiCVelmre, Enn; Udal, AndresPhysica scripta1999 / Proceedings of 18th Nordic Semiconductor Meeting, Linköping, Sweden, June 7-10, 1998, ISBN 91-87308-71-1, p. 193-197: ill https://ui.adsabs.harvard.edu/abs/1999PhST...79..193V/abstract

Electron-beam welding of high-entropy alloy and stainless steel: microstructure and mechanical propertiesSokkalingam, Rathinavelu; Mastanaiah, P.; Muthupandi, Veerappan; Sivaprasad, Katakam; Prashanth, Konda GokuldossMaterials and manufacturing processes2020 / p. 1885-1894 https://doi.org/10.1080/10426914.2020.1802045 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Low-temperature annealing of lightly doped n-4H-SiC layers after irradiation with fast electronsKorolkov, Oleg; Kozlovski, Vitali V.; Lebedev, Alexander A.; Sleptšuk, Natalja; Toompuu, Jana; Rang, ToomasSemiconductors2019 / p. 975−978 https://doi.org/10.1134/S1063782619070133 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Rein Munter: Vesi mäletabMunter, ReinTähenduse Teejuhid2021 / Lk. 9 https://teejuhid.postimees.ee/7319813/rein-munter-vesi-maletab

Влияние донорной примеси на характеристики электрон-фононного взаимодействия к-центров в сульфиде кадмияKrustok, Jüri; Lõo, A.; Piibe, ToomasTallinna Tehnikaülikooli Toimetised1990 / lk. 23-29: ill

Влияние облучения низкоэнергетическими электронами в растровом электронном микроскопе на параметры полупроводниковых приборовMeiler, Boriss; Kropman, Daniel; Levtšenkova, AllaМикроэлектроника1987 / с. 165-169 : илл https://www.ester.ee/record=b2147720*est

О возможности определения времени жизни фотоэлектронов и квантового выхода в поликристаллическом сульфиде кадмияKukk, Peeter-Enn; Varvas, JüriСборник статей по химии и химической технологии. 111964 / с. 237-243 : илл https://www.ester.ee/record=b2181984*est https://digikogu.taltech.ee/et/Item/958b7e78-6cf4-425c-b75d-b028262eada8

Приближенный метод определения времени жизни неравновесных электронов в сульфиде кадмияVarvas, Jüri; Kukk, Peeter-EnnСборник статей по химии и химической технологии. 101964 / с. 257-266 : илл https://www.ester.ee/record=b2181961*est https://digikogu.taltech.ee/et/Item/9569e6db-150a-42c8-bf3b-765725dfd969

Расчет показателя степени в формуле МиллераVelmre, EnnТруды по электротехнике и автоматике : сборник статей. 111973 / с. 145-154 : илл https://www.ester.ee/record=b2190624*est https://digikogu.taltech.ee/et/Item/d6e57925-e104-44e1-a218-c5b3110d9996