A method for battery impedance analysisTenno, Ander; Tenno, Robert; Suntio, TeuvoJournal of the Electrochemical Society2004 / 6, p. A806-A824 https://iopscience.iop.org/article/10.1149/1.1697413 Battery impedance and its relation to battery characteristicsTenno, Ander; Tenno, Robert; Suntio, TeuvoProc. 24th INTELEC Conf., Montreal, Canada, 20022002 / p. 176-183 https://www.researchgate.net/publication/3976210_Battery_impedance_and_its_relationship_to_battery_characteristics Battery impedance characterization through inspection of discharge curve and testing with short pulsesTenno, Ander; Tenno, Robert; Suntio, S.Journal of power sources2006 / 2, p. 1029-1033 : ill https://www.sciencedirect.com/science/article/pii/S0378775305015879 Charge-discharge behaviour of VRLA batteries : model calibration and application for state estimation and failure detectionTenno, Ander; Tenno, Robert; Suntio, TeuvoJournal of power sources2001 / 1, p. 42-53 Electroless nickel plating model for plated-through-hole board manufacturingTenno, Robert; Kantola, K.; Tenno, AnderJournal of electronic materials2006 / 10, p. 1825-1836 : ill https://link.springer.com/content/pdf/10.1007/s11664-006-0164-3.pdf Evaluation of VRLA battery under overcharging : model for battery testingTenno, Ander; Tenno, Robert; Suntio, TeuvoJournal of power sources2002 / p. 65-82 Fast model for monitoring of backup batteries in telecommunications networksTenno, Ander; Tenno, Robert; Suntio, TeuvoProceedings of the IASTED International Conference Power and Energy Systems : May 13-15, 2002, Marina del Rey, California, USA2002 / p. 458-463 Impedance characterization of VRLA batteriesSuntio, Teuvo; Tenno, Ander; Tenno, RobertProc. 9th Power Quality Conference : Nürmberg, Germany, 20032003 / p. 325-330 Soft-sensor approach in characterization of VRLA batteriesTenno, Ander; Tenno, Robert; Suntio, TeuvoProc. INTELEC 20012001 / p. 554-562 The effects of intermittent charging on VRLA battery life expectancy in telecom applicationsSuntio, Teuvo; Waltari, P.; Tenno, Ander; Tenno, RobertProc. 24th INTELEC Conf., Montreal, Canada, 20022002 / p. 121-127