A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chipsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIET computers and digital techniques2009 / 5, p. 476-486 : ill http://dx.doi.org/10.1049/iet-cdt.2008.0096

Design-for-testability for application of external test patterns in a NoCGovind, Vineeth; Raik, Jaan2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC)2008 / [4] p

DfT for application of external test patterns in a Network-on-a-ChipGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 25-28 : ill

DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudeleGovind, Vineeth2009 https://digi.lib.ttu.ee/i/?454 https://www.ester.ee/record=b2539211*est

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 83-86 : ill

Extended checkers for logic-based distributed routing in network-on-chipsNiazmand, Behrad; Hariharan, Ranganathan; Govind, Vineeth; Jervan, Gert; Hollstein, Thomas; Raik, JaanBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 77-80 : ill

A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

Kuidas testida arvutivõrku ränikiibilRaik, Jaan; Govind, VineethA & A2010 / 4, lk. 35-37 https://artiklid.elnet.ee/record=b2286479*est

Low-area boundary BIST architecture for mesh-like network-on-chipRaik, Jaan; Govind, VineethProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 95-100 : ill

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill

Tenniseharrastus Tallinna tehnikaülikoolis. Tennis on au sees : [kommenteerivad Tauno Otto ja Viveeth Govind]Sulling, Andres; Otto, Tauno; Govind, VineethMente et Manu2013 / lk. 26-27 : fot

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

Ultra-low latency NoC testing via pseudo-random test pattern compactionTatenguem, Herve; Govind, Vineeth; Raik, JaanSoC 2012 : International Symposium on System-on-Chip 2012 : Tampere, Finland, October 11-12, 20122012 / 6 p. : ill https://ieeexplore.ieee.org/document/6376370