A global methodology for test program generation starting from high level specificationsStorojev, Sergei; Leveugle, Regis; Saucier, GabrieleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 305-311: ill

A method for identification dynamic parameters of mixed signal circuitsZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 211-215

A method for testing dynamic characteristics of analog-digital converters in spectral domainZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 207-210

A trap detector for precise measurements of optical radiation powerKübarsepp, Toomas; Kärhä, PetriBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 195-200: ill

Actual research topics in mechatronics system designGlesner, M.; Herpel, H.-J.; Kirschbaum, A.; Windirsch, P.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 85-91: ill

Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358

An interesting and effective code for error-correcting in mass-storage devicesSzepessy, AndrasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 331-337

Assurance of gain stability of spaceborne teleradiometersVeismann, Uno; Min, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 179-185: ill

A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

Chaos in electronic circuitsLindberg, ErikBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 29-37: ill

Complementary Darlington circuitMännama, VelloBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 223-228: ill

Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

Design and application of lock-in instrumentsMin, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 95-104: ill

Different ways for optimization of settling time of the 3rd order phase locked loopTammemägi, JaakBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 239-243: ill

Direct sequence spread spectrum digital radioKerek, Daniel; Saluvere, Teet; Tenhunen, HannuBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 159-167: ill

Elektrodenübergangsimpedanz bei bioelektrischen MessungenMärtin, HannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / S. 147-150: Ill

Elements of noise modeling in bipolar semiconductor devicesBlum, AlfonsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 11-27

Experimental study of ultrasonic microprocessor - based heat metersRagauskas, A.; Pamakstis, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 141-145: ill

Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

Identification of signal's sine-wave dominants using analysis of level crossingsRonk, AntsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 233-238: ill

Infared and near-infared Fourier spectrometer PFS 2000 for analytical researchTõnnisson, T.; Lipping, Kalle; Pelt, Jaan; Raadi, G.; Randmets, R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 169-172

Information techniques for sensor- and microsystemsHolmer, R.; Tränkler, Hans-RolfBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 39-50: ill

Intelligence system for design and investigation mechanical values sensorsShmakov, E.M.; Matveev, V.A.; Molotkov, S.V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 261-269: ill

Intelligent diagnostic centers: a new way to distributed fault-toleranceVarkonyi-Koczy, Annamaria R.; Tilly, K.; Dobrowiecki, Tadeusz; Vadasz, B.; Kiss, I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 365-368: ill

Low-noise CMOS-charge amplifier for a silicon strip detectorGrönlund, MarkoBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 217-222: ill

MCM-testMagnhagen, Bengt; Linden, HenricBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 297-304: ill

Measuring electrical bio-impedance - some practical aspectsEek, Andres; Ollmar, S.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / lk. 117-124: ill

Modeling of blood flow measurement system elementsAdaškevicius, R.; Kopustinskas, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 125-131: ill

Monitoring and problems of short-term prognosis in the field of plants protectionButkevicius, R.; Žilinskas, R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 277-281

New method and electronic system for the human brain hydrodynamic diagnosingRagauskas, A.; Daubaris, G.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 133-139: ill

Non-invasive measurement and determination of structural vibration modes of precision controlled motion systemsKaušinis, Saulius; Isoda, AntanasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 271-272: ill

Parallel implementation of the recursive discrete Fourier transformationVarkonyi-Koczy, Annamaria R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 111-115

PLL based scanner stabilizerLipping, KalleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 173-177: ill

Sensors and systems for product data and product identification in CIMHenoch, BengtBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 51-64 : ill

Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295

Software development for programmable instrumentationUsk, AivarBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 255-260: ill

Standards for radiometric calibration of electro-optical devices in EstoniaVeismann, Uno; Pehk, M.; Kübarsepp, ToomasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 187-193: ill

Stepwise Lock-In Signal ConversionParve, ToomasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 245-254: ill

Synchronous detector with MOSFETsKuusik, AlarBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 229-232: ill

Synthesis of hierarchically testable FSM networksKasirova, Lilia; Keevallik, Andres; Kruus, MargusBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 347-352: ill

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

The analysis of integrating sigma-delta ADC noiseGutnikov, V.S.; Krivchenko, T.I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 201-206: ill

The contribution of the artificial intelligence to the measurement scienceDobrowiecki, Tadeusz; Louage, Frank; Pataki, BelaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 105-110: ill

The method of conformance testing for presentation data transfer syntaxShevelkov, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 359-364: ill

The realization of the synchronous signal conditioning and demodulating systemLand, RaulBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 151-158: ill

Trends in artificial intelligence applications for real-time control : (a speculative study)Mõtus, LeoBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 71-83

Ultrasonic sensors - an intelligent sensor principle for many applicationsMagori, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 65-70: ill