Adaptively undersampled image processing for fast multiline laser detectionMõlder, Ago; Märtens, Olev; Saar, Tõnis; Land, Raul2013 IEEE 8th International Symposium on Intelligent Signal Processing (WISP 2013) : proceedings2013 / p. 60-64 : ill [CD-ROM]

Bulk material volume estimation metod and system for logistic applicationsShvarts, Dmitry; Tamre, MartProceedings of the 9th International Conference of DAAAM Baltic Industrial Engineering, 24-26th April 2014, Tallinn, Estonia2014 / p. 289-294 : ill

Databases and Information Systems : 14th International Baltic Conference, DB&IS 2020, Tallinn, Estonia, June 16-19, 2020 : Proceedings2020 https://doi.org/10.1007/978-3-030-57672-1

Deep learning for detection of pavement distress using nonideal photographic imagesTepljakov, Aleksei; Riid, Andri; Pihlak, Rene; Vassiljeva, Kristina; Petlenkov, Eduard2019 42nd International Conference on Telecommunications and Signal Processing (TSP)2019 / p. 195-200 : ill http://doi.org/10.1109/TSP.2019.8769086

Dependence of multifractal analysis parameters on the darkness of a processed imageMartsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Tõkke, Siim; Mikli, ValdekChaos, Solitons & Fractals2022 / art. 111811 https://doi.org/10.1016/j.chaos.2022.111811 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

A digital measuring module for tool wear estimationOtto, Tauno; Kurik, LembitAnnals of DAAAM for 2002 & proceedings of the 13th International DAAAM Symposium "Intelligent Manufacturing & Automation : Learning from Nature" : Vienna University of Technology, 23-26th October 2002, Vienna, Austria, European Union2002 / p. 397-398 : ill

Image based counterfeit coin validationGavrijaševa, Alina; Märtens, OlevBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 153-156 : ill

NB-IoT based visual smart waste management systemZulqarnain Khan, Sikandar; Hein, Haigo; Alam, Muhammad Mahtab; Le Moullec, Yannick; Pärand, Sven2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935601

A novel approach to quantify crack formation in CLTKalbe, Kristo; Kalamees, Targo5th International Conference Forum Wood Building Baltic : 26-28 February 2024, Tallinn, Estonia : proceedings2024 / p. 156-157 : ill https://digikogu.taltech.ee/et/Item/22318c67-e0ef-42f1-88c7-34c9d9677b17

Pavement distress detection with deep learning using the orthoframes acquired by a mobile mapping systemRiid, Andri; Lõuk, Roland; Pihlak, Rene; Tepljakov, Aleksei; Vassiljeva, KristinaApplied sciences2019 / art. 4829, 22 p. : ill https://doi.org/10.3390/app9224829 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Reducible dictionaries for single image super-resolution based on patch matching and mean shiftingRasti, Pejman; Nasrollahi, Kamal; Orlova, Olga; Tamberg, Gert; Moeslund, Thomas B.; Anbarjafari, GholamrezaJournal of electronic imaging2017 / p. 023024-1 - 023024-8 : ill http://dx.doi.org/10.1117/1.JEI.26.2.023024

A two-stream context-aware ConvNet for pavement distress detectionLõuk, Roland; Tepljakov, Aleksei; Riid, Andri2020 43rd International Conference on Telecommunications and Signal Processing : TSP 2020, Milan, Italy, July 7-9, 20202020 / p. 270-273 : ill https://doi.org/10.1109/TSP49548.2020.9163538

Variable-resolution image processing for validation of coinsMärtens, Olev; Saar, Tõnis; Gavrijaševa, Alina; Mõlder, Ago2011 IEEE 7th International Symposium on Intelligent Signal Processing (WISP) : Floriana, Malta, September 19-21, 2011 : proceedings2011 / p. 176-179: ill https://ieeexplore.ieee.org/document/6051711

γ and α-(Fe, Ni) phase characterization using image processing and effect of phase formation on the P/M Fe(100-x)Ni(x) alloys propertiesSingh, Neera; Pandey, Vaibhav; Srivastava, Gargi; Banerjee, Supriya; Parkash, Om; Kumar, DevendraMaterials chemistry and physics2020 / art. 122794 https://doi.org/10.1016/j.matchemphys.2020.122794 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS