Embedded instrumentation toolbox for screening marginal defects and outliers for productionOdintsov, Sergei; Jutman, Artur; Devadze, Sergei; Aleksejev, IgorIEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings2017 / p. 336-334 : ill https://doi.org/10.1109/AUTEST.2017.8080516

FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill

In-field detection of degradation on PCB assembly high-speed busesOdintsov, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 6 p.: ill https://doi.org/10.1109/AUTEST.2018.8532547

Marginal PCB assembly defect detection on DDR3/4 memory busOdintsov, Sergei; Jutman, Artur; Devadze, Sergei2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 20172017 / p. 238-247 : ill https://doi.org/10.1109/TEST.2017.8242070

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

Ways for board and system test to benefit from FPGA embedded instrumentationEhrenberg, Heiko; Odintsov, Sergei; Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Wenzel, Thomas2019 IEEE AUTOTESTCON2019 / 10 p : ill https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057