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26

artikkel kogumikus

Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill

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At-speed on-chip diagnosis of board-level interconnect faultsJutman, ArturNinth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings2004 / p. 2-7 : ill https://www.researchgate.net/publication/4098807_At-speed_on-chip_diagnosis_of_board-level_interconnect_faults

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Automated area and coverage optimization of minimal latency checkersAzad, Siavoosh Payandeh; Niazmand, Behrad; Apneet Kaur; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings2017 / p. 7-8 : ill https://doi.org/10.1109/ETS.2017.7968211

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artikkel ajakirjas EST / artikkel ajakirjas ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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Automated minimization of concurrent online checkers for network-on-chipsSaltarelli, Pietro; Niazmand, Behrad; Hariharan, Ranganathan; Raik, Jaan; Jervan, Gert; Hollstein, Thomas10th International Symposium on Reconfigurable and Communication-centric Systems-on-Chip (ReCoSoC 2015) : Bremen, 29 June - 1 July 20152015 / [8] p. : ill http://dx.doi.org/10.1109/ReCoSoC.2015.7238079

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Automated test bench generation for high-level synthesis flow ABELITEViilukas, Taavi; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Baranov, SamaryProceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 20112011 / p. 13-16 : ill https://ieeexplore.ieee.org/document/6116601

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artikkel ajalehes

Auvere jaama ehitaja on Enefit Powerile maksnud trahvi juba 130 miljonitNikolajev, Jürierr.ee2022 Auvere jaama ehitaja on Enefit Powerile maksnud trahvi juba 130 miljonit

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AWAIT : an ultra-lightweight soft-error mitigation mechanism for network-on-chip linksJanson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, Jaan2018 13th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), Lille, France, July 9th-11th, 20182018 / p. 1-6 : ill https://doi.org/10.1109/ReCoSoC.2018.8449374

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BASTION - board and SoC test instrumentation for Ageing and No Failure FoundDevadze, SergeiMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 77

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BASTION : board and SoC test instrumentation for ageing and no failure foundJutman, Artur; Lotz, Christophe; Larsson, Erik; Sonza Reorda, Matteo; Jenihhin, Maksim; Raik, JaanProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 115-120 : ill https://doi.org/10.23919/DATE.2017.7926968

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Bearing fault analysis of BLDC motor intended for electric scooter applicationKudelina, Karolina; Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)2021 / p. 427-432 https://doi.org/10.1109/SDEMPED51010.2021.9605519

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artikkel ajakirjas

The bearing faults detection methods for electrical machines — the state of the artKhan, Muhammad Amir; Asad, Bilal; Kudelina, Karolina; Vaimann, Toomas; Kallaste, AntsEnergies2023 / art. 296 https://doi.org/10.3390/en16010296

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artikkel kogumikus

Bidirectional DC circuit breaker with improved performance during commissioning and reclosingPogulaguntla, Aditya; Raghavendra I, Venkata; Banavath, Satish Naik; Chub, Andrii; Sreekanth, Thamballa; Krishnamoorthy, Harish Sarma24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)2022 / p. P1-P9 https://ieeexplore.ieee.org/document/9907667

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artikkel ajakirjas EST / artikkel ajakirjas ENG

Broken rotor bar fault detection of the grid and inverter-fed induction motor by effective attenuation of the fundamental componentAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Iqbal, Muhammad NaveedIET electric power applications2019 / p. 2005–2014 https://doi.org/10.1049/iet-epa.2019.0350 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

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artikkel kogumikus

Broken rotor bar fault diagnostic of inverter fed induction motor using FFT, Hilbert and Park's vector approachAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants2018 XIII International Conference on Electrical Machines (ICEM 2018) : Alexandroupoli, Greece, 3-6 September 20182018 / p. 2352-2358 : ill https://doi.org/10.1109/ICELMACH.2018.8506957

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Cable diagnostics methods for determining degradation caused by renewable energy productionKiitam, Ivar; Taklaja, Paul; Niitsoo, Jaan; Hyvonen, Petri2015 IEEE 5th International Conference on Power Engineering, Energy and Electrical Drives (POWERENG) : proceedings : May 11-13, 2015, Riga, Latvia2015 / p. 220-224 : ill

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artikkel ajakirjas EST / artikkel ajakirjas ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

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artikkel kogumikus

Calculation of the diagnosibility of digital circuits without using fault modelsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 159-162 : ill

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Capacitor coupled voltage transformer inaccuracy effect on circuit breaker operationAsefi, Sajjad; Andreesen, Guido; Kilter, Jako; Landsberg, Mart2023 23rd International Scientific Conference on Electric Power Engineering (EPE)2023 / 5 p https://doi.org/10.1109/EPE58302.2023.10149279

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artikkel ajakirjas

Causes of indefinite faults in Estonian 110 kV overhead power gridTaklaja, Paul; Oidram, Rein; Niitsoo, Jaan; Palu, IvoOil shale2013 / p. 225-243 : ill https://artiklid.elnet.ee/record=b2631741*est

artikkel ajakirjas

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artikkel ajakirjas

Changing of magnetic flux density distribution in a squirrel-cage induction motor with broken rotor barsVaimann, Toomas; Belahcen, Anouar; Kallaste, AntsElektronika ir elektrotechnika = Electronics and electrical engineering2014 / p. 11-14 : ill

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artikkel kogumikus

Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

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artikkel kogumikus

Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networksUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 20092009 / p. 385-390 https://ieeexplore.ieee.org/document/5206232

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artikkel kogumikus

Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

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Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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