Otsing - TalTech teadusportaal

kuva

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26

artikkel kogumikus

Applicability of the energetic erosion theory to hardened steelsKleis, Ilmar; Remi, ToomasOST-03 Symposium on Machine Design2003 / p. 245-252 : ill

artikkel kogumikus

27

artikkel kogumikus

Application of nanoindentation for constituent phases testing in ceramic–metal compositesHussainova, Irina; Jasiuk, Iwona; Hussainov, MedhatTechnical proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010. Vol. 1, Nanotechnology 2010 : Advanced materials, CNTs, Particles, Films and Composites2010 / p. 152-155 : ill

artikkel kogumikus

28

artikkel kogumikus

Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292

artikkel kogumikus

29

artikkel kogumikus

Approaches to improve hierarchical ATPG for synchronous sequential circuitsViilukas, TaaviInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 105-108 : ill

artikkel kogumikus

30

artikkel ajakirjas

Arterial pulse wave analysis during cold pressor test in patients with borderline hypertension [Electronic resource]Hlimonenko, Irina; Meigas, Kalju; Vahisalu, ReinIFMBE proceedings2005 / [5] p. [CD-ROM]

artikkel ajakirjas

31

dissertatsioon

Aspect-oriented model-based testing = Aspekt-orienteeritud mudeli-põhine testimineSarna, Külli2018 https://digi.lib.ttu.ee/i/?11065

dissertatsioon

32

artikkel kogumikus EST / artikkel kogumikus ENG

Aspect-oriented Model-based testing with UPPAAL timed automataVain, Jüri; Tsiopoulos, Leonidas; Kanter, GertModel and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. 117-124 https://doi.org/10.1007/978-3-030-78428-7_10 Conference Proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

33

artikkel kogumikus

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

artikkel kogumikus

34

artikkel kogumikus

Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill

artikkel kogumikus

35

artikkel kogumikus

Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

artikkel kogumikus

36

artikkel ajakirjas

Assessment of durability of environmentally friendly wood-based panelsKallavus, Urve; Järv, Hele; Kalamees, Targo; Kurik, LembitEnergy procedia2017 / p. 207–212 : ill https://doi.org/10.1016/j.egypro.2017.09.756

artikkel ajakirjas

37

artikkel kogumikus

Assessment of the potential of lubricated contact condition laboratory testing and surface analysis for improving the performance of machine elements. Comparison of model and real component test methodsAntonov, Maksim; Michalczewski, Remigiusz; Pasaribu, Richard; Piekoszewski, Witold18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 55

artikkel kogumikus

38

artikkel kogumikus

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

artikkel kogumikus

39

artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

artikkel kogumikus

40

dissertatsioon

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

dissertatsioon

41

artikkel kogumikus

At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill http://dx.doi.org/10.1109/ATS.2015.21

artikkel kogumikus

42

artikkel kogumikus

Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

artikkel kogumikus

43

artikkel ajakirjas

Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill

artikkel ajakirjas

44

artikkel kogumikus

Automated test pattern generator with constraint solverViilukas, Taavi; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 33-36

artikkel kogumikus

45

artikkel kogumikus

Automated XML-based test modelling for mixed-signal circuitsMellik, AndresBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 203-204 : ill

artikkel kogumikus

46

artikkel kogumikus

Automatic distribution of local testers for testing distributed systemsVain, Jüri; Halling, Evelin; Kanter, Gert; Anier, Aivo; Pal, DeepakDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 297-310 : ill http://dx.doi.org/10.3233/978-1-61499-714-6-297

artikkel kogumikus

47

artikkel kogumikus

Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730

artikkel kogumikus

48

artikkel kogumikus

Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

artikkel kogumikus

49

artikkel kogumikus

Automation of testing beyond the SoCsTšertov, Anton; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 29-32 : ill

artikkel kogumikus

50

artikkel ajakirjas

Automation of the 3-phase induction motor type test place for industrial useKuusk, Leho; Laugis, JuhanBaltic electrical engineering review1998 / 1, p. 10-12

artikkel ajakirjas

testimine (märksõna)

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