Universal mitigation of NBTI-induced aging by design randomization
author
Jenihhin, Maksim
Kamkin, Alexander
Navabi, Zainalabedin
Sadeghi-Kohan, Somayeh
statement of authorship
Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi-Kohan
source
Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
location of publication
[S.l.]
publisher
IEEE
year of publication
2017
pages
[5] p. : ill
conference name, date
2016 IEEE East-West Design and Test Symposium, EWDTS 2016, October 14-17, 2016
conference location
Yerevan, Armenia
url
http://dx.doi.org/10.1109/EWDTS.2016.7807635
subject term
nanoelektroonika
projekteerimine
ISSN
2472-761X
ISBN
978-1-5090-0693-9
notes
Bibliogr.: 28 ref
TalTech department
arvutisüsteemide instituut
language
inglise