Study on power losses of the full soft-switching current-fed DC/DC converter with Si and GaN devices

statement of authorship
Andrii Chub, Jacek Rabkowski, Andrei Blinov, Dmitri Vinnikov
location of publication
[S.l.]
publisher
year of publication
pages
p. 13-18
conference name, date
41st Annual Conference of the IEEE Industrial Electronics Society (IECON 2015), November 9-12, 2015
conference location
Yokohama, Japan
keyword
Si MOSFET
wide band gap semiconductor devices
ISBN
978-1-4799-1761-7
TTÜ department
language
inglise