SiC-diode forward surge current failure mechanisms : experiment and simulation
author
Velmre, Enn
Udal, Andres
statement of authorship
E. Velmre, A. Udal
source
ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France
location of publication
[S.l.]
year of publication
1997
pages
p. 1671-1674
url
https://www.sciencedirect.com/science/article/abs/pii/S0026271497001364
subject term
ränikarbiid
seadmed
dioodid
simulatsioon
language
inglise