Leakage currents in 4H-SiC JBS diodes
author
Ivanov, Pavel
Korolkov, Oleg
Sleptšuk, Natalja
statement of authorship
P. A. Ivanov, ... O. Korol’kov and N. Sleptsuk [et al.]
source
Semiconductors
journal volume number month
Vol. 46, no. 3
year of publication
2012
pages
p. 397-400 : ill
url
https://link.springer.com/article/10.1134/S106378261203013X
subject term
dioodid
ränikarbiid
kristallistruktuur
defektid
spektroskoopia
pinge (elektrotehnika)
ISSN
1063-7826
notes
Bibliogr.: 9 ref
Original Russian text: P.A. Ivanov, I.V. Grekhov, A.S. Potapov, O.I. Kon’kov, N.D. Il’inskaya, T.P. Samsonova, O. Korol’kov, N. Sleptsuk, 2012, published in Fizika i Tekhnika Poluprovodnikov, 2012, Vol. 46, No. 3, pp. 411–415
language
inglise