Calculation of the diagnosibility of digital circuits without using fault models
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
R.Ubar, S.Kostin, J.Raik
source
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2008
pages
p. 159-162 : ill
conference name, date
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : the 11th Biennial Baltic Electronics Conference, October 6-8, 2008
conference location
Tallinn, Estonia
subject term
digitaalelektroonika
diagnostika (tehnika)
rikked
mudelid
ISSN
1736-3705
ISBN
978-1-4244-2059-9
notes
Bibliogr.: 10 ref
language
inglise